Introduction:There are many people who need to make electrical measurements but who are not necessarily experts in that field. Countless applications require measurements such as current, voltage, resistivity, temperature, etc., often to a quality level that is not easily achievable. Whether choosing test equipment, designing a test system, or simply trying to carry out measurements using existing equipment, you need to understand the fundamental checks to ensure your final measurements meet requirements.
Those participating in this seminar will learn:The four-step process to designing your test system.1.Fundamentals in using data sheets to choose the appropriate equipment;2.How to test your system to ensure it meets requirements;3.Identifying sources of error in the system;4.Techniques for reducing errors in your measurements.
Target Audience:
This seminar is recommended for scientists / engineers who need to perform electrical measurements but who have little experience in doing so.

Introduction:Even though FLASH memory is a well-established memory technology, continuous advances, such as multi-level cell (MLC), are aimed at achieving increased density. New measurement techniques and capabilities are also becoming available, from characterizing a single transistor for development purposes to integrated and automated solutions for FLASH production.
During this webinar, fundamentals of FLASH technology testing will be reviewed, incorporating a discussion of FN (Fowler-Nordheim) and (HEI) (Hot Electron Injection) programming and erasing. Different aspects of testing applicable to single FLASH transistors and FLASH array testing will be considered, including standard transistor characterization, endurance, and disturb testing. The pulse fidelity requirement for MLC testing will also be discussed. These applications will be demonstrated via Keithley's new Ultra Fast I-V test solution, which offers better control of the pulse shape and amplitude, and, as a result, is well-suited for MLC FLASH testing, and also Keithley's ACS software, which manages a range of testing scenarios.
Target Audience
This webinar will be beneficial for people with established FLASH test setups, as well as those looking for a test solution.

Introduction:This on-line seminar explores the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.
Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. It will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given.
Target Audience:
Students, researchers, and engineers doing characterization of materials, processes, and devices
Lab managers wanting to learn about this useful measurement technique
Engineers doing device and material reliability studies (WLR, ESD, latchup, etc.)

Introduction:Phase Change Memory, a type of non-volatile computer memory also known as PRAM, PCM, and PCRAM, is a new and promising technology. PRAM uses the unique behavior of chalcogenide glass, which can be switched between two states, crystalline and amorphous, with the application of heat. Recent versions can achieve two additional distinct states, effectively doubling its storage capacity.
This webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley抯 ultra-fast IV unit.
Target Audience:
This seminar is recommended primarily for test engineers and test engineering managers who are new to making PRAM measurements, but it will be useful for the experienced user, as well.

Introduction:This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.
Those participating in this seminar will learn:
1. What is C-V testing?
2. For what types of devices can C-V testing be used to characterize?
3. Who can use C-V?
4. C-V measurement challenges
Target Audience
Engineers new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, characterization lab managers.

Introduction:With less capital available for continuous system "upgrades", new data center solutions must be flexible and energy efficient to support the multi-faceted expansions to keep ahead of users data storage needs. Engineers are leveraging open industry standards like PCI Express (PCIe) and SAS/SATA, to create cost-efficient architectures which address current and future data center requirements. In this webinar, we are going to discuss the key concerns that system designers face while designing high-speed interconnects and the solutions that can support PCIe 2.5/5.0G and SAS/SATA 3.0/6.0G. National Semiconductor is ready for the future system requirements.

Introduction:NXP is an active member of the HDMI Consortium, and was one of the first to invent HDMI connectors. NXP's offering extend to a complete system solution, used today by several of the world's key SoC manufacturers. We operate our own HDMI compliance test facility in Caen, France, where we carry out the strictest of ESD testing and product requirements.
During this webinar, I will provide an overview of the HDMI switches available from NXP today, and describe the special features which help to differentiate our products. I will also give you a glimpse of NXP's implementation of the latest HDMI 1.4 specifications. I look forward to your participation in this webinar.