Introduction:Thyristors and Triacs are widely used by White Goods applications and in designs that required AC loads. This webinar will touch on the basics and family of Thryistors and Triacs and explain the leading advantage that NXP has in the Thyristor technologies. It will also enable you to understand what causes false triggering and highlight the benefits of using 3 Quadrant Triacs as well as the advantages of replacing mechanical relays with Triacs.

Introduction:Silicon tuners have entered the broadcasting scene more than ten years ago with one of the earliest application in Satellite STB. However since the beginning of last year more applications and even TV are using Silicon tuners. This webinar will explain the reasons that drive this implementation. It will highlight the benefits compared to the traditional tuner module.
The webinar will also touch on the importance of the tuner and will focus on the tuner parameters that are essential to meet system requirements. To most people, the most important parameter is the sensitivity and linearity of the tuner is often neglected. The webinar will enable you to understand why linearity is also crucial especially for operators.

Introduction:Keeping test systems cost effective and efficient is the goal of every test engineer. When more than one device under test (DUT) or points of test are incorporated in the system, routing of signals becomes necessary. Understanding the switching of these signals from DUT to source or measure is important for system integrity. Designing the switching to meet the needs of the system requires knowledge of the DUTs, the number of DUTs, signal levels, speed required, and equipment that performs the routing of the signals. This seminar presents the basics of switching, from types of switches (relays, transistors, etc.) to switching systems (multiplexer, matrix, etc.). Those that participate in the seminar will learn and understand: • Types of switches (relays, transistors, etc.) • Types of switching systems (multiplexer, matrix, etc.) • Signal types to be routed (DC, AC, RF, etc.) • Using multiple types of signal routing and switching in one system • How to improve speed and accuracy of the system
Target Audience: This seminar is recommended for test engineers and system designers in production environments who wish to get a better understanding of switching in test systems.

Introduction:NXP standalone LCD display drivers bring high reliability and low power consumption to a broad range of applications. They require no external components, operate over a wide temperature range, support a wide range of supply voltages and integrate vital interfaces. For automotive applications, we even have options that are AEC-Q100 complaint, ensuring reliable operation under the harshest conditions.
This webinar will introduce NXP’s portfolio of segment, character and graphic (or dot-matrix) display drivers. We will also explain the theory of a LCD driver and provide some insights into Chip-On-Glass technology and its benefits.

Introduction:This seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type. Participants in this seminar will learn:  • What are Hall Effect measurements?  • Who can use Hall Effect measurements?  • What industry trends are driving the need for Hall Effect measurements?  • What are the key considerations when selecting equipment for Hall Effect measurements?  • What techniques will help ensure quality measurements?
Target Audience: This seminar is recommended for materials scientists and physicists studying the electrical properties of new materials such as new nanomaterials, and engineers, materials scientists, and physicists developing thin films for solar/photovoltaic applications, working with compound semiconductor materials, or studying the properties of carbon-based devices as well as for all characterization lab managers and anyone new to semiconductor materials and testing.

Introduction:This seminar is designed to help reliability engineers understand and implement state-of-the-art Bias Temperature Instability (BTI) measurements using Ultra-Fast I-V methods. The first segment of the seminar examines the current theory of positive and negative BTI (PBTI and NBTI) mechanisms in ultra thin film transistors. The second segment addresses the measurement challenges and defines the best methods for Ultra-Fast I-V measurements for capturing both degradation and recovery characteristics. Those participating in this seminar will learn:  • The current theories behind modeling NBTI and PBTI  • Challenges associated with characterizing BTI degradation and recovery  • State-of-the-art measurement techniques for modeling and process control  • Limitations in Ultra-Fast I-V including Johnson Noise and others  • Tips on characterizing measurement system performance
Target Audience: This seminar is intended for those whose job requires performing semiconductor reliability characterization measurements. The material is particularly beneficial for students, technicians, engineers, and lab managers who are responsible for developing test systems and methodologies to address the need of ultra thin film transistor reliability.

Introduction:Electrical resistivity is a basic material property and is a very common electrical measurement. Specific resistivity measurement methods are used depending upon the type of material, whether conductor, insulator, or semiconductor. This webinar provides details on the various resistivity methods and techniques used to achieve optimal results. Participants will learn the fundamentals of making resistivity measurements on bulk materials. The methods vary depending on if the material is a conductor, an insulator, or a semiconductor. Some of the specific methods include making four-wire resistance measurements of metals, volume and surface resistivity measurements of insulators, and four-point collinear probe and van der Pauw measurement methods of semiconductor materials. In addition to discussing these methods, measurements techniques that pertain to the method are also detailed. Some of the many techniques and sources of error discussed include electrostatic interference and shielding, leakage current and guarding, thermoelectric EMFs and offset compensation, and others. Along with using the proper method and techniques, the appropriate instrumentation must also be used to make the desired measurements. Target Audience This webinar is recommended for materials researchers, research labs, physicists, universities, and companies who need to test resistivity of their products (solar cell, plastics, paper, tires, semiconductor, etc.)