Introduction:There are many people who need to make electrical measurements but who are not necessarily experts in that field. Countless applications require measurements such as current, voltage, resistivity, temperature, etc., often to a quality level that is not easily achievable. Whether choosing test equipment, designing a test system, or simply trying to carry out measurements using existing equipment, you need to understand the fundamental checks to ensure your final measurements meet requirements.
Those participating in this seminar will learn:The four-step process to designing your test system.1.Fundamentals in using data sheets to choose the appropriate equipment;2.How to test your system to ensure it meets requirements;3.Identifying sources of error in the system;4.Techniques for reducing errors in your measurements.
Target Audience:
This seminar is recommended for scientists / engineers who need to perform electrical measurements but who have little experience in doing so.

Introduction:Your Customers & Prospects are All Going Virtual. Are You Ready to Keep Their Business?
A must attend event for software vendors wishing to confidently introduce licensing and pricing models that support and control the utilization of their application(s) in virtual environments, enabling them to protect their applications from copy and duplication, ensure their competitive position, and even increase profitability!
  •  Brief Introduction to Virtualization
  •  Virtualization - What's in it For Me (as an ISV)?
  •  New Licensing Challenges Fueled by Virtualization
  •  How to Monetize Software in Virtual Environments? - License Enablement and Enforcement!
  •  Industry Best Practices - Turning Virtualization from a Headache to an Opportunity!

Introduction:This on-line seminar explores the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.
Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. It will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given.
Target Audience:
Students, researchers, and engineers doing characterization of materials, processes, and devices
Lab managers wanting to learn about this useful measurement technique
Engineers doing device and material reliability studies (WLR, ESD, latchup, etc.)