Introduction:This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration to process reliability monitoring. The speed and accuracy of the WLR testing impact time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advanced WLR measurements. By participating in this seminar, you will learn and understand: How to estimate the speed and throughput impact of parallel WLR testing on traditional reliability structures; How to assess traditional test structures for use in a parallel test system; The source of measurement errors that impact WLR measurements; Typical configuration, measurement, and optimization techniques.
Target Audience: This seminar is recommended for engineers who are new to semiconductor reliability testing, test engineers who need to accelerate WLR testing, and QRA lab managers.

Introduction:The search to replace FG NAND and fast development of alternate non-volatile memory (NVM) technologies, such as Phase-Change memory (PCM/PRAM), Ferro-electric memory (FeRAM), Magnetoresistive memory (MRAM), and Resitive memory (ReRAM) is currently underway. Advanced characterization capabilities are critical for success of any new technology. Despite a significant variety in memory technologies, all of them share the need for the same type of characterization, such as transient switching behavior, endurance, and the need for dynamic current measurement. Non-Volatile Memory - Characterization and Measurement Techniques will discuss and provide examples on the common characterization and measurement techniques for various NVM technologies, including FLASH, PRAM, ReRAM, and FeRAM. This webinar will also provide an overview of improvements in standard instrumentation that provide pulse source and measurement with a single instrument that measures the current and voltage simultaneously while applying multi-pulse waveforms to a memory device or material.
Target Audience: This seminar is recommended primarily for NVM test engineers, researchers, and test engineering managers, but it will be useful for any engineer or researcher/student in the NVM field.

Introduction:In this seminar, we will identify, discuss, and propose solutions for a number of challenges related to high voltage wafer level parametric test. Some key areas include: • High voltage probe card requirements • The risks of hot switching and cable charging • Protecting low voltage instruments during high voltage testing • High voltage parametric test roadmap
Target Audience: This webinar is intended for test department engineers and managers in the semiconductor industry that are interested in learning more about the practical issues related to high voltage parametric test and characterization in a production environment.

Introduction:Printed and organic electronics is a novel and unconventional technology that has the potential to change the world of electronics. This technology offers the opportunity to manufacture low-cost electronic solutions that are not compatible with today’s standard inorganic electronics. To achieve this potential, making accurate measurements on fabricated devices and printable inks will be essential in fully understanding the electrical properties and operational characteristics of materials and devices. Knowing how to reduce various sources of measurement errors will be critical to success. This seminar presents methods and best measurement practices for electrically characterizing printed and organic electronics and materials. Application examples where such measurement principles are required will be discussed. Those participating in this seminar will learn and understand: • Measurement techniques required for measuring the conductivity of printable e-inks and I-V characteristics of organic electronics • Sources of measurement error that will affect such measurements • Measurement solutions that can be used in printed and organic electronics measurement applications Target Audience: This seminar is recommended for students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and organic/semiconductor device development who wish to get a better understanding of basic electrical measurements.

Introduction:Keeping test systems cost effective and efficient is the goal of every test engineer. When more than one device under test (DUT) or points of test are incorporated in the system, routing of signals becomes necessary. Understanding the switching of these signals from DUT to source or measure is important for system integrity. Designing the switching to meet the needs of the system requires knowledge of the DUTs, the number of DUTs, signal levels, speed required, and equipment that performs the routing of the signals. This seminar presents the basics of switching, from types of switches (relays, transistors, etc.) to switching systems (multiplexer, matrix, etc.). Those that participate in the seminar will learn and understand: • Types of switches (relays, transistors, etc.) • Types of switching systems (multiplexer, matrix, etc.) • Signal types to be routed (DC, AC, RF, etc.) • Using multiple types of signal routing and switching in one system • How to improve speed and accuracy of the system
Target Audience: This seminar is recommended for test engineers and system designers in production environments who wish to get a better understanding of switching in test systems.

Introduction:The target objective of the majority of research into photovoltaic devices is in the areas of improving the conversion efficiency and lowering the cost of manufacturing. In order to verify that conversion efficiency has improved, a photovoltaic device must be electrically characterized. This seminar will discuss the different measurement techniques that can be used to characterize solar cells.
By participating in this webinar, you will learn and understand:
•  How to measure short-circuit current (Isc), open circuit voltage (Voc), maximum power output (Pmax), and conversion efficiency
•  How to select the correct instrumentation
•  Best practices to connect to the device
Target Audience:
This seminar is recommended for students, engineers and engineering managers who have a basic understanding of photovoltaic devices.

Introduction:NXP standalone LCD display drivers bring high reliability and low power consumption to a broad range of applications. They require no external components, operate over a wide temperature range, support a wide range of supply voltages and integrate vital interfaces. For automotive applications, we even have options that are AEC-Q100 complaint, ensuring reliable operation under the harshest conditions.
This webinar will introduce NXP’s portfolio of segment, character and graphic (or dot-matrix) display drivers. We will also explain the theory of a LCD driver and provide some insights into Chip-On-Glass technology and its benefits.

Introduction:This webinar provides an overview of the electrical test equipment that is required to properly test today's High Power High Brightness LEDs. We will discuss how large die LEDs and LED modules are driving the need for test equipment with greater current capacity and greater output waveform flexibility, as well as the proper cabling required to support these capabilities. The thyristor effect of LEDs will also be covered, including what it is, how to detect it, and how modern test equipment can make detection easy. By participating in this webinar, you will learn and understand: •How large die LEDs and LED modules are driving demand for test equipment with greater power and pulse width modulation. •The proper cabling necessary for testing high power LEDs. •The thyristor effect on LEDs and how to detect it. Target Audience: This webinar is recommended for researchers, test engineers, and test engineering managers who are involved in the development and production of High Brightness LEDs.

Introduction:High temperature accounts for 55% of electronic product failures. In general, a 1℃ increase above the maximum limit can lead to 5% reduction in the product's reliability.
The second part in a series on thermography, this webinar teaches you how to: 1. Use a thermal imager to supplement routine tests by tools like oscilloscopes and multimeters. 2. Gain a better understanding of the load profile of components using a color-coded thermal profile. 3. Use a thermal imager to locate problems like short circuits or components in the absence of in-circuit or functional testing.
Engineers attending the webinar take away the knowledge and tools that aid better circuit design, lower power consumption and higher conversion efficiency.