Introduction:Even though FLASH memory is a well-established memory technology, continuous advances, such as multi-level cell (MLC), are aimed at achieving increased density. New measurement techniques and capabilities are also becoming available, from characterizing a single transistor for development purposes to integrated and automated solutions for FLASH production.
During this webinar, fundamentals of FLASH technology testing will be reviewed, incorporating a discussion of FN (Fowler-Nordheim) and (HEI) (Hot Electron Injection) programming and erasing. Different aspects of testing applicable to single FLASH transistors and FLASH array testing will be considered, including standard transistor characterization, endurance, and disturb testing. The pulse fidelity requirement for MLC testing will also be discussed. These applications will be demonstrated via Keithley's new Ultra Fast I-V test solution, which offers better control of the pulse shape and amplitude, and, as a result, is well-suited for MLC FLASH testing, and also Keithley's ACS software, which manages a range of testing scenarios.
Target Audience
This webinar will be beneficial for people with established FLASH test setups, as well as those looking for a test solution.

Introduction:This on-line seminar explores the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.
Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. It will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given.
Target Audience:
Students, researchers, and engineers doing characterization of materials, processes, and devices
Lab managers wanting to learn about this useful measurement technique
Engineers doing device and material reliability studies (WLR, ESD, latchup, etc.)

Introduction:Phase Change Memory, a type of non-volatile computer memory also known as PRAM, PCM, and PCRAM, is a new and promising technology. PRAM uses the unique behavior of chalcogenide glass, which can be switched between two states, crystalline and amorphous, with the application of heat. Recent versions can achieve two additional distinct states, effectively doubling its storage capacity.
This webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley’s ultra-fast IV unit.
Target Audience:
This seminar is recommended primarily for test engineers and test engineering managers who are new to making PRAM measurements, but it will be useful for the experienced user, as well.

Introduction:This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.
Those participating in this seminar will learn:
1. What is C-V testing?
2. For what types of devices can C-V testing be used to characterize?
3. Who can use C-V?
4. C-V measurement challenges
Target Audience
Engineers new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, characterization lab managers.

Introduction:This seminar describes the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.
Participant Objectives:
By participating in this seminar, you will learn and understand:
1. Measurement techniques required for measuring very small currents
2. Sources of measurement error that will affect such low current measurements
3. Measurement solutions that can be used in low current measurement applications
Target Audience:
This seminar is recommended for students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development who wish to get a better understanding of low current electrical measurements.

Introduction:This seminar will discuss on what are the different uses of the Guard Output. When you attend this web seminar, you will understand the purpose of Guard in the Triax cables. Also you will learn how to use Guard in test fixtures and obtain fast output voltage readings from high output impedance devices as well as how to measure resistance values of components without removing them from the PCB.

1. The purpose of Guard in the Triax cables
2. How to use Guard in test fixtures
3. Obtaining fast output voltage readings from high output impedance devices
4. Measuring resistance values of components without removing them from the PCB

Introduction:This webinar will outline the electrical measurements of photovoltaic development from basic research to early production, focusing on discussion of the physical measurements being made as well as the theory and cell properties that can be inferred from the results. Sponsored by Keithley Instruments, this webinar will encompass Capacitance-Voltage characterization and Current-Voltage characterization including DC and pulse techniques as well as common measurements of a cell's efficiency.
We will cover:
• What measurements need to be made on photovoltaic devices?
• What can you learn about a device through electrical characterization?
• Special considerations for test labs and systems working with photovoltaics

Introduction:This seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type.

Participant Objectives
Participants in this seminar will learn:
• What are Hall Effect measurements?
• Who can use Hall Effect measurements?
• What industry trends are driving the need for Hall Effect measurements?
• What are the key considerations when selecting equipment for Hall Effect measurements?

Introduction:This seminar will discuss on what are the different uses of the Guard Output. When you attend this web seminar, you will understand the purpose of Guard in the Triax cables. Also you will learn how to use Guard in test fixtures and obtain fast output voltage readings from high output impedance devices as well as how to measure resistance values of components without removing them from the PCB.
1. The purpose of Guard in the Triax cables
2. How to use Guard in test fixtures
3. Obtaining fast output voltage readings from high output impedance devices
4. Measuring resistance values of components without removing them from the PCB

Introduction:Advanced OFDM (Orthogonal Frequency Division Multiplex) technologies impose additional challenges and requirements for testing new wireless communication devices and systems. This paper compares and contrasts traditional single-carrier modulation schemes with multi-carrier OFDM schemes to understand the test equipment and measurement considerations when using modern vector signal generators and analyzers. It covers in detail spectrum, power, and modulation quality measurements and techniques for R&D and high-speed production test applications. The paper covers testing of both SISO (single-input, single-output) and MIMO (multiple-input, multiple-output) communications systems used in 802.11n WLAN, 802.16e mobile-WiMAX Wave 2, which are also applicable to future LTE and UMB cellular standards.