Introduction:This on-line seminar explores the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.
Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. It will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given.
Target Audience:
Students, researchers, and engineers doing characterization of materials, processes, and devices
Lab managers wanting to learn about this useful measurement technique
Engineers doing device and material reliability studies (WLR, ESD, latchup, etc.)

Introduction:This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.
Those participating in this seminar will learn:
1. What is C-V testing?
2. For what types of devices can C-V testing be used to characterize?
3. Who can use C-V?
4. C-V measurement challenges
Target Audience
Engineers new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, characterization lab managers.

Introduction:This seminar describes the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.
Participant Objectives:
By participating in this seminar, you will learn and understand:
1. Measurement techniques required for measuring very small currents
2. Sources of measurement error that will affect such low current measurements
3. Measurement solutions that can be used in low current measurement applications
Target Audience:
This seminar is recommended for students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development who wish to get a better understanding of low current electrical measurements.

Introduction:Have you ever had trouble designing a new sensor? If so, don't miss the chance to learn how to easily compare hundreds of sensors and complete your sensor path design with National's new online tool. In this webinar, we will go through a new tool with three simple steps: learn about and explore sensors, compare and select the best sensor for your application, and then design and build your solution. We will also share with you design tips and considerations that will support your time-to-market plans.

Introduction:In the past, FPGAs were typically low density and low performance梪sed primarily as "glue" logic to piece together a system. Today, FPGAs are high density, high performance components梪sed to implement major system functionality. Since the current trend is to use multiple FPGAs on a PCB, how do you effectively and efficiently integrate the two? New FPGA/PCB concurrent design processes and tools significantly improve system performance, product costs, and designer productivity. This session will discuss these new design approaches.