Introduction:In this seminar, we will identify, discuss, and propose solutions for a number of challenges related to high voltage wafer level parametric test. Some key areas include: • High voltage probe card requirements • The risks of hot switching and cable charging • Protecting low voltage instruments during high voltage testing • High voltage parametric test roadmap
Target Audience: This webinar is intended for test department engineers and managers in the semiconductor industry that are interested in learning more about the practical issues related to high voltage parametric test and characterization in a production environment.

Introduction:Printed and organic electronics is a novel and unconventional technology that has the potential to change the world of electronics. This technology offers the opportunity to manufacture low-cost electronic solutions that are not compatible with today’s standard inorganic electronics. To achieve this potential, making accurate measurements on fabricated devices and printable inks will be essential in fully understanding the electrical properties and operational characteristics of materials and devices. Knowing how to reduce various sources of measurement errors will be critical to success. This seminar presents methods and best measurement practices for electrically characterizing printed and organic electronics and materials. Application examples where such measurement principles are required will be discussed. Those participating in this seminar will learn and understand: • Measurement techniques required for measuring the conductivity of printable e-inks and I-V characteristics of organic electronics • Sources of measurement error that will affect such measurements • Measurement solutions that can be used in printed and organic electronics measurement applications Target Audience: This seminar is recommended for students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and organic/semiconductor device development who wish to get a better understanding of basic electrical measurements.

Introduction:Keeping test systems cost effective and efficient is the goal of every test engineer. When more than one device under test (DUT) or points of test are incorporated in the system, routing of signals becomes necessary. Understanding the switching of these signals from DUT to source or measure is important for system integrity. Designing the switching to meet the needs of the system requires knowledge of the DUTs, the number of DUTs, signal levels, speed required, and equipment that performs the routing of the signals. This seminar presents the basics of switching, from types of switches (relays, transistors, etc.) to switching systems (multiplexer, matrix, etc.). Those that participate in the seminar will learn and understand: • Types of switches (relays, transistors, etc.) • Types of switching systems (multiplexer, matrix, etc.) • Signal types to be routed (DC, AC, RF, etc.) • Using multiple types of signal routing and switching in one system • How to improve speed and accuracy of the system
Target Audience: This seminar is recommended for test engineers and system designers in production environments who wish to get a better understanding of switching in test systems.

Introduction:Welcome to the NXP Semiconductors Microcontroller Webinar. In this webinar NXP will give an overview of the Microcontroller portfolio and what are the Cortex-M Microcontrollers that NXP has from the cores & families perspective. A natural question: “What are the differences between NXP Cortex-M Microcontrollers versus other semiconductor suppliers?” would be addressed. Please join us to learn more about the Cortex-M Microcontrollers that are available from NXP.

Introduction:Radar designers are confronted with ever increasing demands for more functionality, precision, range and reliability. Modern Active Electronically Scanned Array Radars highlight some of these challenges. These radars allow multiple target acquisition and tracking using beam steering techniques. There can be thousands of Transmit / Receive Modules (TRM’s) per radar system which need compact and efficient designs. These challenges demand state of the art RF performance with proven repeatability and reliability. This webinar will enable you to understand how NXP’s product offerings meet these demands for Radar Systems design, particularly with respect to components available from our High Performance RF business line.

Introduction:The target objective of the majority of research into photovoltaic devices is in the areas of improving the conversion efficiency and lowering the cost of manufacturing. In order to verify that conversion efficiency has improved, a photovoltaic device must be electrically characterized. This seminar will discuss the different measurement techniques that can be used to characterize solar cells.
By participating in this webinar, you will learn and understand:
•  How to measure short-circuit current (Isc), open circuit voltage (Voc), maximum power output (Pmax), and conversion efficiency
•  How to select the correct instrumentation
•  Best practices to connect to the device
Target Audience:
This seminar is recommended for students, engineers and engineering managers who have a basic understanding of photovoltaic devices.

Introduction:This webinar provides an overview of the electrical test equipment that is required to properly test today's High Power High Brightness LEDs. We will discuss how large die LEDs and LED modules are driving the need for test equipment with greater current capacity and greater output waveform flexibility, as well as the proper cabling required to support these capabilities. The thyristor effect of LEDs will also be covered, including what it is, how to detect it, and how modern test equipment can make detection easy. By participating in this webinar, you will learn and understand: •How large die LEDs and LED modules are driving demand for test equipment with greater power and pulse width modulation. •The proper cabling necessary for testing high power LEDs. •The thyristor effect on LEDs and how to detect it. Target Audience: This webinar is recommended for researchers, test engineers, and test engineering managers who are involved in the development and production of High Brightness LEDs.

Introduction:NXP provides high performance analog switches in all common configurations tailored to answer specific application needs and ease design efforts. This is achieved with the new NX3 family of switches which offer very low on-resistance and build-in translators/level shifters option. They are available in a wide variety of small/leadless packages to meet today’s stringent board space constraints and reliability requirements.

Introduction:This seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type. Participants in this seminar will learn:  • What are Hall Effect measurements?  • Who can use Hall Effect measurements?  • What industry trends are driving the need for Hall Effect measurements?  • What are the key considerations when selecting equipment for Hall Effect measurements?  • What techniques will help ensure quality measurements?
Target Audience: This seminar is recommended for materials scientists and physicists studying the electrical properties of new materials such as new nanomaterials, and engineers, materials scientists, and physicists developing thin films for solar/photovoltaic applications, working with compound semiconductor materials, or studying the properties of carbon-based devices as well as for all characterization lab managers and anyone new to semiconductor materials and testing.

Introduction:This seminar is designed to help reliability engineers understand and implement state-of-the-art Bias Temperature Instability (BTI) measurements using Ultra-Fast I-V methods. The first segment of the seminar examines the current theory of positive and negative BTI (PBTI and NBTI) mechanisms in ultra thin film transistors. The second segment addresses the measurement challenges and defines the best methods for Ultra-Fast I-V measurements for capturing both degradation and recovery characteristics. Those participating in this seminar will learn:  • The current theories behind modeling NBTI and PBTI  • Challenges associated with characterizing BTI degradation and recovery  • State-of-the-art measurement techniques for modeling and process control  • Limitations in Ultra-Fast I-V including Johnson Noise and others  • Tips on characterizing measurement system performance
Target Audience: This seminar is intended for those whose job requires performing semiconductor reliability characterization measurements. The material is particularly beneficial for students, technicians, engineers, and lab managers who are responsible for developing test systems and methodologies to address the need of ultra thin film transistor reliability.