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Introduction:Even though FLASH memory is a well-established memory technology, continuous advances, such as multi-level cell (MLC), are aimed at achieving increased density. New measurement techniques and capabilities are also becoming available, from characterizing a single transistor for development purposes to integrated and automated solutions for FLASH production.
During this webinar, fundamentals of FLASH technology testing will be reviewed, incorporating a discussion of FN (Fowler-Nordheim) and (HEI) (Hot Electron Injection) programming and erasing. Different aspects of testing applicable to single FLASH transistors and FLASH array testing will be considered, including standard transistor characterization, endurance, and disturb testing. The pulse fidelity requirement for MLC testing will also be discussed. These applications will be demonstrated via Keithley's new Ultra Fast I-V test solution, which offers better control of the pulse shape and amplitude, and, as a result, is well-suited for MLC FLASH testing, and also Keithley's ACS software, which manages a range of testing scenarios.
Target Audience
This webinar will be beneficial for people with established FLASH test setups, as well as those looking for a test solution.

Introduction:Your Customers & Prospects are All Going Virtual. Are You Ready to Keep Their Business?
A must attend event for software vendors wishing to confidently introduce licensing and pricing models that support and control the utilization of their application(s) in virtual environments, enabling them to protect their applications from copy and duplication, ensure their competitive position, and even increase profitability!
• Brief Introduction to Virtualization
• Virtualization - What's in it For Me (as an ISV)?
• New Licensing Challenges Fueled by Virtualization
• How to Monetize Software in Virtual Environments? - License Enablement and Enforcement!
• Industry Best Practices - Turning Virtualization from a Headache to an Opportunity!

Introduction:Phase Change Memory, a type of non-volatile computer memory also known as PRAM, PCM, and PCRAM, is a new and promising technology. PRAM uses the unique behavior of chalcogenide glass, which can be switched between two states, crystalline and amorphous, with the application of heat. Recent versions can achieve two additional distinct states, effectively doubling its storage capacity.
This webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley’s ultra-fast IV unit.
Target Audience:
This seminar is recommended primarily for test engineers and test engineering managers who are new to making PRAM measurements, but it will be useful for the experienced user, as well.

Introduction:In today's system design, design cycle time is very short. In many cases, power supply design is put as the last task and PCB space left behind for power circuit is very limited. This issue can be solved by the LMZ-series of power modules introduced by National Semiconductor. SIMPLE SWITCHER Power Module series is an enhancement of the highly successful SIMPLE SWITCHER® family; the new series has a higher level of integration and user can experience new meaning of "ease of use".
The power modules provide the efficiency of a synchronous switching regulator with the simplicity of a linear regulator, eliminating the external inductor and complex layout placement challenges typical of switching regulator designs.
Besides explaining the features of SIMPLE SWITCHER Power Module, this web seminar will touch on the new WEBENCH Power Architect design tool. The enhanced WEBENCH Power Architect enables engineers to rapidly create multi-output DC-DC power supplies for an entire system. SIMPLE SWITCHER Power Module & Power Architect works hand in hand to tackle any power issue from concept to prototype in unprecedented short period of time.

Introduction:This webinar will outline the electrical measurements of photovoltaic development from basic research to early production, focusing on discussion of the physical measurements being made as well as the theory and cell properties that can be inferred from the results. Sponsored by Keithley Instruments, this webinar will encompass Capacitance-Voltage characterization and Current-Voltage characterization including DC and pulse techniques as well as common measurements of a cell's efficiency.
We will cover:
• What measurements need to be made on photovoltaic devices?
• What can you learn about a device through electrical characterization?
• Special considerations for test labs and systems working with photovoltaics

Introduction:The functional characteristics of Capacitive mTouch™ Sensing Solution along with basic touch sensor construction will be reviewed in the first half of this web seminar. The primary focus here is to provide some basic design guidelines relating to touch sensor pad size, placement, cover plate material selection and mounting recommendations. In the second half, there will be an overview of the fundamental components of an Inductive mTouch™ system. It will also introduce the inductive touch sensor detailing both construction and operational characteristics. Inductive touch sensing technologies can make up for some deficiencies of capacitive touch sensing solution. For instance, there can be more choices of panel material, the keys are unaffected by water droplet, humidity or liquids; and the technology can sense through thick gloves.

Introduction:With LabVIEW, engineers and scientists can acquire and output real-world signals, analyze data for meaningful information, develop embedded or autonomous systems, and share results with displays, reports, and the Web. Watch this webcast to learn the fundamentals of graphical programming and discover how LabVIEW can benefit your applications by providing data acquisition and signal generation, signal processing and analysis, connectivity with third-party hardware and software, and desktop, embedded and industrial deployment.
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