Introduction:Even though FLASH memory is a well-established memory technology, continuous advances, such as multi-level cell (MLC), are aimed at achieving increased density. New measurement techniques and capabilities are also becoming available, from characterizing a single transistor for development purposes to integrated and automated solutions for FLASH production.
During this webinar, fundamentals of FLASH technology testing will be reviewed, incorporating a discussion of FN (Fowler-Nordheim) and (HEI) (Hot Electron Injection) programming and erasing. Different aspects of testing applicable to single FLASH transistors and FLASH array testing will be considered, including standard transistor characterization, endurance, and disturb testing. The pulse fidelity requirement for MLC testing will also be discussed. These applications will be demonstrated via Keithley's new Ultra Fast I-V test solution, which offers better control of the pulse shape and amplitude, and, as a result, is well-suited for MLC FLASH testing, and also Keithley's ACS software, which manages a range of testing scenarios.
Target Audience
This webinar will be beneficial for people with established FLASH test setups, as well as those looking for a test solution.

Introduction:Phase Change Memory, a type of non-volatile computer memory also known as PRAM, PCM, and PCRAM, is a new and promising technology. PRAM uses the unique behavior of chalcogenide glass, which can be switched between two states, crystalline and amorphous, with the application of heat. Recent versions can achieve two additional distinct states, effectively doubling its storage capacity.
This webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley’s ultra-fast IV unit.
Target Audience:
This seminar is recommended primarily for test engineers and test engineering managers who are new to making PRAM measurements, but it will be useful for the experienced user, as well.

Introduction:In today's system design, design cycle time is very short. In many cases, power supply design is put as the last task and PCB space left behind for power circuit is very limited. This issue can be solved by the LMZ-series of power modules introduced by National Semiconductor. SIMPLE SWITCHER Power Module series is an enhancement of the highly successful SIMPLE SWITCHER® family; the new series has a higher level of integration and user can experience new meaning of "ease of use".
The power modules provide the efficiency of a synchronous switching regulator with the simplicity of a linear regulator, eliminating the external inductor and complex layout placement challenges typical of switching regulator designs.
Besides explaining the features of SIMPLE SWITCHER Power Module, this web seminar will touch on the new WEBENCH Power Architect design tool. The enhanced WEBENCH Power Architect enables engineers to rapidly create multi-output DC-DC power supplies for an entire system. SIMPLE SWITCHER Power Module & Power Architect works hand in hand to tackle any power issue from concept to prototype in unprecedented short period of time.

Introduction:NXP is an active member of the HDMI Consortium, and was one of the first to invent HDMI connectors. NXP's offering extend to a complete system solution, used today by several of the world's key SoC manufacturers. We operate our own HDMI compliance test facility in Caen, France, where we carry out the strictest of ESD testing and product requirements.
During this webinar, I will provide an overview of the HDMI switches available from NXP today, and describe the special features which help to differentiate our products. I will also give you a glimpse of NXP's implementation of the latest HDMI 1.4 specifications. I look forward to your participation in this webinar.

Introduction:The functional characteristics of Capacitive mTouch^™ Sensing Solution along with basic touch sensor construction will be reviewed in the first half of this web seminar. The primary focus here is to provide some basic design guidelines relating to touch sensor pad size, placement, cover plate material selection and mounting recommendations. In the second half, there will be an overview of the fundamental components of an Inductive mTouch^™ system. It will also introduce the inductive touch sensor detailing both construction and operational characteristics. Inductive touch sensing technologies can make up for some deficiencies of capacitive touch sensing solution. For instance, there can be more choices of panel material, the keys are unaffected by water droplet, humidity or liquids; and the technology can sense through thick gloves.

Introduction:NXP has over 10 years of experience in Class D amps. We offer a broad range of amps for low-, medium- and high-power applications with specially developed features that ensure robust performance, and bring exceptional value by reducing external components and offering pin-to-pin compatibility for greater design flexibility. During this Webinar I wish to give you an overview of NXP's Class D amps and the special features which help to differentiate our products. I will also introduce several key amps within the range to highlight their characteristics in low, medium and high-power applications.
I invite you to join me for this webinar as I showcase the benefits and usage scenarios of NXP's Class D audio amplifiers.