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[Description] This seminar is designed to help laboratory engineers implement, troubleshoot, and verify pulsed I-V, transient I-V, and general Ultra-Fast I-V measurement systems. The seminar will provide the keys to getting good measurements. Topics to be discussed include system setup, typical measurement limitations, and results from some actual devices.
By participating in this seminar, you will learn and understand:
How to properly connect an Ultra-Fast I-V instrument to a probe station;
Common problems encountered when not properly cabled;
Tips on performance verification at the probe tips;
Limitations in Ultra-Fast I-V including Johnson Noise and others;
Typical examples of Ultra-Fast I-V on sample devices.
Target Audience: This seminar is intended for those whose job requires performing all types of characterization measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining characterization equipment and probe stations will also benefit from this seminar.
Target Audience: This seminar is intended for those whose job requires performing all types of characterization measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining characterization equipment and probe stations will also benefit from this seminar.
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