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Presenter:
Lee Stauffer - Senior Staff Technologist, Keithley Instruments, Inc.
Lee Stauffer is Senior Staff Technologist for Keithley Instruments' Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
 
 
 
 

Webinar Introduction


This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.

Those participating in this seminar will learn:
1. What is C-V testing?
2. For what types of devices can C-V testing be used to characterize?
3. Who can use C-V?
4. C-V measurement challenges

Target Audience
Engineers new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, characterization lab managers.
 
 
Company Introduction

Keithley Instruments, Inc. designs, develops, manufactures and markets complex electronic instruments and systems geared to the specialized needs of electronics manufacturers for high-performance production testing, process monitoring, product development and research. The Company has approximately 500 products used to source, measure, connect, control or communicate direct current (DC), radio frequency (RF) or optical signals. Product offerings include integrated systems solutions, along with instruments and personal computer (PC) plug-in boards that can be used as system components or stand-alone solutions. The Company's customers are engineers, technicians and scientists in manufacturing, product development and research functions. Additional company and product information is available at www.keithley.com.