Asia Webinar

New Methods for Testing FLASH Memory

Keithley — 2010-07-08

Even though FLASH memory is a well-established memory technology, continuous advances, such as multi-level cell (MLC), are aimed at achieving increased density. New measurement techniques and capabilities are also becoming available, from characterizing a single transistor for development purposes to integrated and automated solutions for FLASH production.
During this webinar, fundamentals of FLASH technology testing will be reviewed, incorporating a discussion of FN (Fowler-Nordheim) and (HEI) (Hot Electron Injection) programming and erasing. Different aspects of testing applicable to single FLASH transistors and FLASH array testing will be considered, including standard transistor characterization, endurance, and disturb testing. The pulse fidelity requirement for MLC testing will also be discussed. These applications will be demonstrated via Keithley's new Ultra Fast I-V test solution, which offers better control of the pulse shape and amplitude, and, as a result, is well-suited for MLC FLASH testing, and also Keithley's ACS software, which manages a range of testing scenarios.
Target Audience
This webinar will be beneficial for people with established FLASH test setups, as well as those looking for a test solution.

Licensing for Profit in Virtual Environments

SafeNet — 2010-06-18

Your Customers & Prospects are All Going Virtual. Are You Ready to Keep Their Business?
A must attend event for software vendors wishing to confidently introduce licensing and pricing models that support and control the utilization of their application(s) in virtual environments, enabling them to protect their applications from copy and duplication, ensure their competitive position, and even increase profitability!
  •  Brief Introduction to Virtualization
  •  Virtualization - What's in it For Me (as an ISV)?
  •  New Licensing Challenges Fueled by Virtualization
  •  How to Monetize Software in Virtual Environments? - License Enablement and Enforcement!
  •  Industry Best Practices - Turning Virtualization from a Headache to an Opportunity!

Fundamentals of Ultra-Fast I-V Device Characterization

Keithley — 2010-06-08

This on-line seminar explores the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.
Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. It will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given.
Target Audience:
Students, researchers, and engineers doing characterization of materials, processes, and devices
Lab managers wanting to learn about this useful measurement technique
Engineers doing device and material reliability studies (WLR, ESD, latchup, etc.)

Phase Change Memory - Fundamentals and Measurement Techniques

Keithley — 2010-04-22

Phase Change Memory, a type of non-volatile computer memory also known as PRAM, PCM, and PCRAM, is a new and promising technology. PRAM uses the unique behavior of chalcogenide glass, which can be switched between two states, crystalline and amorphous, with the application of heat. Recent versions can achieve two additional distinct states, effectively doubling its storage capacity.
This webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley��s ultra-fast IV unit.
Target Audience:
This seminar is recommended primarily for test engineers and test engineering managers who are new to making PRAM measurements, but it will be useful for the experienced user, as well.

SIMPLE SWITCHER Power Module�CSimplest way to solve your power supply need efficiently

National Semiconductor — 2010-02-04

In today's system design, design cycle time is very short. In many cases, power supply design is put as the last task and PCB space left behind for power circuit is very limited. This issue can be solved by the LMZ-series of power modules introduced by National Semiconductor. SIMPLE SWITCHER Power Module series is an enhancement of the highly successful SIMPLE SWITCHER? family; the new series has a higher level of integration and user can experience new meaning of "ease of use".
The power modules provide the efficiency of a synchronous switching regulator with the simplicity of a linear regulator, eliminating the external inductor and complex layout placement challenges typical of switching regulator designs.
Besides explaining the features of SIMPLE SWITCHER Power Module, this web seminar will touch on the new WEBENCH Power Architect design tool. The enhanced WEBENCH Power Architect enables engineers to rapidly create multi-output DC-DC power supplies for an entire system. SIMPLE SWITCHER Power Module & Power Architect works hand in hand to tackle any power issue from concept to prototype in unprecedented short period of time.

Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals

Keithley — 2009-12-14

This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.
Those participating in this seminar will learn:
1. What is C-V testing?
2. For what types of devices can C-V testing be used to characterize?
3. Who can use C-V?
4. C-V measurement challenges
Target Audience
Engineers new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, characterization lab managers.

How to Get the Most from Your Low Current Measurement Instruments

Keithley — 2009-11-20

This seminar describes the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.
Participant Objectives:
By participating in this seminar, you will learn and understand:
1. Measurement techniques required for measuring very small currents
2. Sources of measurement error that will affect such low current measurements
3. Measurement solutions that can be used in low current measurement applications
Target Audience:
This seminar is recommended for students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development who wish to get a better understanding of low current electrical measurements.

Driving High Speed Signals in Data Center Servers and Storage Area Networks

National Semiconductor — 2009-10-28

With less capital available for continuous system "upgrades", new data center solutions must be flexible and energy efficient to support the multi-faceted expansions to keep ahead of users data storage needs. Engineers are leveraging open industry standards like PCI Express (PCIe) and SAS/SATA, to create cost-efficient architectures which address current and future data center requirements. In this webinar, we are going to discuss the key concerns that system designers face while designing high-speed interconnects and the solutions that can support PCIe 2.5/5.0G and SAS/SATA 3.0/6.0G. National Semiconductor is ready for the future system requirements.

HDMI 1.3, 1.4 for TV & STB solutions

NXP — 2009-08-17

NXP is an active member of the HDMI Consortium, and was one of the first to invent HDMI connectors. NXP's offering extend to a complete system solution, used today by several of the world's key SoC manufacturers. We operate our own HDMI compliance test facility in Caen, France, where we carry out the strictest of ESD testing and product requirements.
During this webinar, I will provide an overview of the HDMI switches available from NXP today, and describe the special features which help to differentiate our products. I will also give you a glimpse of NXP's implementation of the latest HDMI 1.4 specifications. I look forward to your participation in this webinar.

Tips and Tricks in using Guard output

Keithley — 2009-06-15

This seminar will discuss on what are the different uses of the Guard Output. When you attend this web seminar, you will understand the purpose of Guard in the Triax cables. Also you will learn how to use Guard in test fixtures and obtain fast output voltage readings from high output impedance devices as well as how to measure resistance values of components without removing them from the PCB.

1. The purpose of Guard in the Triax cables
2. How to use Guard in test fixtures
3. Obtaining fast output voltage readings from high output impedance devices
4. Measuring resistance values of components without removing them from the PCB

Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells

Keithley — 2009-06-08

This webinar will outline the electrical measurements of photovoltaic development from basic research to early production, focusing on discussion of the physical measurements being made as well as the theory and cell properties that can be inferred from the results. Sponsored by Keithley Instruments, this webinar will encompass Capacitance-Voltage characterization and Current-Voltage characterization including DC and pulse techniques as well as common measurements of a cell's efficiency.
We will cover:
? What measurements need to be made on photovoltaic devices?
? What can you learn about a device through electrical characterization?
? Special considerations for test labs and systems working with photovoltaics

Hall Effect Measurements Fundamentals

Keithley — 2009-06-01

This seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. Hall Effect measurement systems are commonly used to determine semiconductor parameters, such as carrier mobility and carrier concentration, Hall coefficient, and conductivity and conductivity type.

Participant Objectives
Participants in this seminar will learn:
• What are Hall Effect measurements?
• Who can use Hall Effect measurements?
• What industry trends are driving the need for Hall Effect measurements?
• What are the key considerations when selecting equipment for Hall Effect measurements?

An Introduction to New Products for More Effective Power Solutions

Texas Instruments — 2009-05-27

Texas Instruments (TI) offers complete power solutions with a full line of high-performance products. These products, which range from standard linear regulators to switching regulators to power supply controllers to plug-in and integrated power solutions, are tailored to meet design challenges in every segment. And, TI makes designing easier by providing leading-edge support tools such as training, a broad selection of evaluation modules (EVMs), application notes, comprehensive technical documentation and more.
During this webinar Brad wish to give you an overview of TI��s power products and introduce new power management products ranging from power supply controllers to DC-DC Converters to digital power controllers to High power PoE controllers with special features.

NXP introduces industry's fastest ARM Cortex M3 MCU

NXP — 2009-05-15

NXP recently released the industry's fastest ARM? Cortex?-M3 based family of microcontrollers, the LPC1700 series. Running at speeds of up to 100 MHz, LPC1700 microcontrollers are 28 - 64% faster than comparable Cortex-M3 microcontrollers available on the market today.
During this Webinar, I will provide an overview of the LPC1700's key features and benefits, enabling it to offer best-in-class performance. I look forward to your participation.

Microchip mTouch™ Sensing Solutions

Microchip — 2009-04-23

The functional characteristics of Capacitive mTouch^™ Sensing Solution along with basic touch sensor construction will be reviewed in the first half of this web seminar. The primary focus here is to provide some basic design guidelines relating to touch sensor pad size, placement, cover plate material selection and mounting recommendations. In the second half, there will be an overview of the fundamental components of an Inductive mTouch^™ system. It will also introduce the inductive touch sensor detailing both construction and operational characteristics. Inductive touch sensing technologies can make up for some deficiencies of capacitive touch sensing solution. For instance, there can be more choices of panel material, the keys are unaffected by water droplet, humidity or liquids; and the technology can sense through thick gloves.

Class D Audio Amplifiers - NXP's expertise improves quality and performance

NXP — 2009-04-15

NXP has over 10 years of experience in Class D amps. We offer a broad range of amps for low-, medium- and high-power applications with specially developed features that ensure robust performance, and bring exceptional value by reducing external components and offering pin-to-pin compatibility for greater design flexibility. During this Webinar I wish to give you an overview of NXP's Class D amps and the special features which help to differentiate our products. I will also introduce several key amps within the range to highlight their characteristics in low, medium and high-power applications.
I invite you to join me for this webinar as I showcase the benefits and usage scenarios of NXP's Class D audio amplifiers.

Tips and Tricks in using Guard output

Keithley — 2009-04-02

This seminar will discuss on what are the different uses of the Guard Output. When you attend this web seminar, you will understand the purpose of Guard in the Triax cables. Also you will learn how to use Guard in test fixtures and obtain fast output voltage readings from high output impedance devices as well as how to measure resistance values of components without removing them from the PCB.
1. The purpose of Guard in the Triax cables
2. How to use Guard in test fixtures
3. Obtaining fast output voltage readings from high output impedance devices
4. Measuring resistance values of components without removing them from the PCB

Dimming LEDs with a Conventional Triac Wall Dimmer: Solutions and Design Tips

National Semiconductor — 2009-03-26

Dimming of LEDs can extend the lifetime even further and also reduces power drain. Today��s TRIAC phase-control wall dimmers are designed to interface with pure resistive load, such as incandescent or halogen light bulbs. Since an LED bulb does not appear as a resistive load to the TRIAC wall dimmer, dimming an LED bulb using a conventional TRIAC wall dimmer does not yield good dimming performance. In this Webinar, we will discuss in detail the challenges of LED dimming with a conventional triac wall dimmer and how National��s new triac dimmable offline LED driver overcomes the issues and achieves full 100:1 range of uniform, flicker-free dimming. This solution enables truly direct LED light bulb replacement of existing incandescent or halogen bulb systems connected to standard TRIAC wall dimmers.

Power Distribution Architecture for Communication Infrastructure Applications

National Semiconductor — 2009-03-17

Most of the telecom systems today contain on board high performance processors, FPGAs and ASICs. A cost effective solution that can drive these systems while delivering high current levels at low output voltages, fast transient response and tight regulation is in high demand. All these requirements raise the bar for the next generation power distribution architectures (PDAs), which in turn inspire evolution of new technologies. This seminar will discuss the evolution of PDAs, as well as key features and technical details of several power distribution systems. It will conclude with market share predictions of different PDAs for the next 5 years.

Solving Tough Half-bridge Power Brick Design Challenges

National Semiconductor — 2009-03-11

Along with larger data communications capacity, and limited by BTS space, power density requirement in telecom power module has increased dramatically over the past few years. Half-bridge with secondary synchronous rectifier is an effective power topology to improve the power density. It can help minimize the transformer size, decrease the output inductor size and offer many advantages compared to active clamp topology. However, there are also challenges in designing with Half-bridge. This seminar will discuss the advantages of Half-bridge topology and provide solutions to the design issues.