Description: Thyristors and Triacs are widely used by White Goods applications and in designs that required AC loads. This webinar will touch on the basics and family of Thryistors and Triacs and explain the leading advantage that NXP has in the Thyristor technologies. It will also enable you to understand what causes false triggering and highlight the benefits of using 3 Quadrant Triacs as well as the advantages of replacing mechanical relays with Triacs.

Description: Switching Mode Power Supply(SMPS)is a popular topology used in most of the power supply designs. This webinar explores some of the NXP discrete products which could be used in SMPS for various functions, from low to high power requirements. It explains power efficiency features in some of NXP devices which will be very helpful in improving power efficiency of SMPS design.
It is explained in this presentation how innovation in packaging and IC designs used by NXP could produce products which could help power supply designer to reduce loss and heat dissipation in their application.

Description: In this seminar, we will identify, discuss, and propose solutions for a number of challenges related to high voltage wafer level parametric test. Some key areas include: • High voltage probe card requirements • The risks of hot switching and cable charging • Protecting low voltage instruments during high voltage testing • High voltage parametric test roadmap
Target Audience: This webinar is intended for test department engineers and managers in the semiconductor industry that are interested in learning more about the practical issues related to high voltage parametric test and characterization in a production environment.

Description: Silicon tuners have entered the broadcasting scene more than ten years ago with one of the earliest application in Satellite STB. However since the beginning of last year more applications and even TV are using Silicon tuners. This webinar will explain the reasons that drive this implementation. It will highlight the benefits compared to the traditional tuner module.
The webinar will also touch on the importance of the tuner and will focus on the tuner parameters that are essential to meet system requirements. To most people, the most important parameter is the sensitivity and linearity of the tuner is often neglected. The webinar will enable you to understand why linearity is also crucial especially for operators.

Description: Printed and organic electronics is a novel and unconventional technology that has the potential to change the world of electronics. This technology offers the opportunity to manufacture low-cost electronic solutions that are not compatible with today’s standard inorganic electronics. To achieve this potential, making accurate measurements on fabricated devices and printable inks will be essential in fully understanding the electrical properties and operational characteristics of materials and devices. Knowing how to reduce various sources of measurement errors will be critical to success. This seminar presents methods and best measurement practices for electrically characterizing printed and organic electronics and materials. Application examples where such measurement principles are required will be discussed. Those participating in this seminar will learn and understand: • Measurement techniques required for measuring the conductivity of printable e-inks and I-V characteristics of organic electronics • Sources of measurement error that will affect such measurements • Measurement solutions that can be used in printed and organic electronics measurement applications Target Audience: This seminar is recommended for students, researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and organic/semiconductor device development who wish to get a better understanding of basic electrical measurements.

Description: Keeping test systems cost effective and efficient is the goal of every test engineer. When more than one device under test (DUT) or points of test are incorporated in the system, routing of signals becomes necessary. Understanding the switching of these signals from DUT to source or measure is important for system integrity. Designing the switching to meet the needs of the system requires knowledge of the DUTs, the number of DUTs, signal levels, speed required, and equipment that performs the routing of the signals. This seminar presents the basics of switching, from types of switches (relays, transistors, etc.) to switching systems (multiplexer, matrix, etc.). Those that participate in the seminar will learn and understand: • Types of switches (relays, transistors, etc.) • Types of switching systems (multiplexer, matrix, etc.) • Signal types to be routed (DC, AC, RF, etc.) • Using multiple types of signal routing and switching in one system • How to improve speed and accuracy of the system
Target Audience: This seminar is recommended for test engineers and system designers in production environments who wish to get a better understanding of switching in test systems.